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Question+ Z& w5 \2 q w: Q. Y8 c1 J: {% d
The first sentence of clause 3.4.3.1 of IEC 60384-14 states: ”Capacitors of each technology, rated5 B k: B, M8 L1 |7 q; k
voltage, class and sub-class shall be separately qualified”.
* y1 x0 O R' |3 M0 ^If it is requested to qualify a dual-class X/Y capacitor (e.g. X1:400 V, Y2:250V), is it permissible to4 _' l1 z) [3 l% B! o% g/ O
perform one type test only by applying for each individual test the highest test severity?
' T1 `9 F& l2 s# p4 RTo qualify a dual-class X/Y capacitor, testing laboratories may have different interpretations of this
2 Z) t5 ~# }' {- w \sentence.
9 z0 y/ \3 V/ BInterpretation a): Some testing laboratories test the same capacitor series once for X1 and once for
# } F1 X# @8 S8 pY2 at the same time in separate type tests.9 h2 H( M" e* M2 w" Q" T) K2 c
Interpretation b): Other testing laboratories follow the opinion that the safety of the capacitors is also* b' t8 W1 \1 S8 v0 g1 C
assured if a mixture of highest testing (peak) voltages of both sub-classes is used. This means worst% P- Y2 u* Z$ J0 h2 L# w
case testing, covering both sub-classes for certification.! [0 ~3 H9 v, f. S0 x& }
Both interpretations may possibly lead to the result of compliance or non-compliance of the capacitor,8 S& x% r5 s/ J/ `) b5 M7 y5 J
as in a) more samples are tested and in b) a single capacitor is more stressed.% A% S% r& I) }
From the technical point of view, it should be acceptable to perform one type test only by applying the' P, U" H7 Q' T1 W4 L4 h8 p
highest test severity for each test.
. X0 D a3 i* qDecision
# c8 o/ W+ J* B* c! l& S) vWhen a range of dual-class capacitors (X/Y) is qualified, it is allowed to perform one type test only, if1 I( Y6 ]4 B5 A1 D! l. o4 d
the highest severity of the X or Y class is applied in each respective test.4 n1 i9 j7 f" G( L3 Y
( V6 F) B- n$ W. a8 u) j
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