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| DSH 731; t4 D' y+ `- z7 j7 O7 c5 L
. z, V- ]) c% h/ h/ Q | Ambient temperature on tripping tests3 L- t4 s& F: a7 `0 j! {, `
| 9.9.2.3
2 i8 Z9 O+ ]) j5 T1 [! J | 61009-1(ed.2);am1;am2
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Standard(s)- No. Year3 n5 x3 n, P8 a1 s
IEC 61009-1:2006-06, Ed. 2.29 K" g( i V) V8 t
DSH 0731 20098 c% a, i* x5 U* }
Category: POW, PROT9 ~) L4 \5 s6 z+ ^7 }7 u
Subclause(s): 9.9.2.38 m1 o$ V$ Y& K$ n
Developed by: CTL-ETF7. C" f: m9 b9 V2 ^0 ]4 x8 e1 a9 _
Subject: Ambient temperature on tripping tests
& V* r9 m/ j* Z1 W9 r/ jKey words:7 _ p g% b; s3 g6 w
Ambient temperature
0 Q3 d+ K# E1 [Tripping characteristic
2 |7 j; ^0 [* \; M3 P9 ZDecision approved at the 2009 CTL Plenary Meeting' e) n, I5 a7 u
Question:' |5 P7 i8 E, [ r( \% h
In item a) of clause 9.9.2.3, is it correct to perform tripping tests in an ambient
2 Z) T J* P9 ]temperature of 35 °C ± 2 °C above the ambient air reference temperature?
9 C8 X9 A4 x( sDecision:
% S: L) ? L$ ^$ h% T2 e: _: W% {6 gNo, the word “above” shall be replaced by “below” in the sentences of item a) of clause9 D# z" g4 h- G, l5 S: ]( B& F
9.9.2.3 to perform tripping tests in -5 °C.2 Y0 o' I/ v5 m! e+ G* y' u0 m
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