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|  DSH 405
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; b# }: `5 P4 o0 X | Leakage current in secondary circuits& F+ P$ u7 m4 P2 i' I
| 17g)- _# \6 K% h4 I+ `! L6 x
| 60601-1(ed.2);am1;am2
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0 H" U2 W$ x8 ?2 iStandard(s)- (year and edition): N5 `8 U' V! } ]
IEC 60601-1:1988 Ed.2 Am1+Am2
; X2 ^6 D U( L( MSub clause(s): 17 g)
4 ?3 {' e; h: d, f4 ySheet n°: DSH-405
7 [6 O1 C. M/ H2 x6 J3 [+ Q/ e) k( I. zSubject: Leakage current in secondary circuits
2 Z2 z8 t2 Q6 P1 @- V: E, |Key words: Leakage current, secondary circuit4 y, W4 e( m1 K- I/ R" s4 k/ L- U
Confirmed by CTL at its 39th meeting, in Cologne
1 i; ?. z8 _; _- K8 D2 F* OQuestion:
% Y- O5 J4 K* W4 \7 K$ e+ O0 Y3 tIf secondary circuit impedances limit the leakage current, is further investigation of secondary l6 q# `& d0 a
circuits required? (refer to sub-clause 52.5).. `7 A3 M% G5 F3 A) o9 {7 O
Decision:/ T. e ]1 Z/ U" e
Secondary circuits providing protective means after short-circuiting of inadequate AIR
" b- r" [. Q& [, _CLEARANCE and CREEPAGE DISTANCE must be investigated. Failure of components in; I: `1 ~6 I: Q% w
these circuits shall be investigated as a SINGLE FAULT CONDITION. Failure of such9 Q' g+ [" }4 ^
components shall be investigated as a SINGLE FAULT CONDITION.
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发表于 2012-11-5 11:42
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