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由于我的标准上有公司名字，就不直接贴上了，差异部分如下' N. U v: T; u* `
y' I& O* D) s, w
Page 9; h# }1 w4 E: @, n+ [, J
1 Scope and object6 r: r' A3 L" p& E/ B
Replace the title of this clause by “Scope”
; }) ^& N: p: n% M+ T2 {( c1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.
% D# {6 z$ Q) q. ^- wPage 11
! N H8 i/ S" Y2 Normative references E0 p! a7 {* J9 V& w/ c* z
Replace the text by the following:
! C( i. s; b; ^. {The following referenced documents are indispensable for the application of this document.
; j1 V% r- @7 D4 m2 a& r7 fFor dated references, only the edition cited applies. For undated references, the latest edition- U# ~0 c0 v' S! p
of the referenced document (including any amendments) applies.
1 u: x) k, ^2 JIEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:1 y& w. }! Y! Z: h- e) M: v
Electromagnetic compatibility
9 b! Q* M3 h' B c
+ W6 u( F( ^% ]( T$ N! ?1 ]4 D9 @( ?9 @4 ~" g. Z% l+ D3 w" g
CISPR 14-2 Amend. 2 © IEC:2008 – 3 –
& m# d9 \6 N$ `3 ^IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and1 u; X3 |) y" H
measurement techniques – Electrostatic discharge immunity test& R/ d5 g3 C4 e* b( h; H4 c% H0 L
Amendment 1:19987 X3 h0 e6 m+ U* m5 e! N
Amendment 2:20001
9 {$ D0 F# L- hIEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and
6 i+ n3 x: x$ U: V: Imeasurement techniques – Radiated, radio-frequency, electromagnetic field immunity test. f6 Y$ U) E) |$ H# h7 b
Amendment 1:200721 y; `% N' [7 {1 N
IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and7 U' o, X1 z4 u
measurement techniques – Electrical fast transient/burst immunity test- c9 m, |; P d' _: W4 Y" p. m
IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
, s# M/ d9 _5 p' r, f6 o; Dmeasurement techniques – Surge immunity test9 b* U2 T" H+ w7 M$ e/ p
IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and& \ S8 S8 J3 Z6 g( j
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency+ J2 W; B: }8 i8 E( K
fields
& v* u% N9 @ ?* C$ O7 yAmendment 1:2004
, W/ w* P7 H' H9 s+ ~( lAmendment 2:20063. J0 H }2 g+ q% Q1 R; y" |" C
IEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and
1 `3 Z7 l1 _# X m kmeasurement techniques – Voltage dips, short interruptions and voltage variations immunity tests7 S3 _$ @0 J; Q; l7 H6 ^; B3 O; O8 z
CISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,
: w# e0 n9 F) n" n1 N9 e0 @electric tools and similar apparatus – Part 1: Emission
5 Y/ V! H Q: x8 @: a! W' C' vPage 136 b, L! \$ Y/ I1 |; j8 {; y, Y
3 Definitions
+ B" U+ ~+ e- Z8 {* V" e0 vReplace the title of this clause by “Terms and definitions”.
( ~; s" d- e9 U7 \3 M0 DReplace the first paragraph by the following:
5 ~6 S5 f2 ^: ~$ i/ `2 l8 QFor the purposes of this document, the terms and definitions related to EMC and related
. A8 C7 h7 _( e4 o- Yphenomena found in IEC 60050-161, as well as the following terms and definitions apply.8 p! m, r) s) }3 |
Add the following new definition:, T: V% M$ {/ ^! G x; N
3.18; g* s% \ O" P- S9 k& j7 w. D8 i2 z- U
clock frequency8 w/ y; C& B" ]: L z
fundamental frequency of any signal used in the device, excluding those which are solely; [0 a4 x; U7 i9 T7 M. k/ T- @8 n6 }
used inside integrated circuits (IC)
1 R7 E& \1 D( }" k }. ~2 ENOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
9 q9 q1 _) H% W' zfrom lower clock oscillator frequencies outside the IC.
/ _; b8 a6 ?. b v5 u0 p$ E# D! w___________
" e; p! J4 i8 _& h* g1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
i7 L0 H; q7 Q, |% w2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.
5 s2 T3 {+ S9 S j+ A; N3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.
9 n! x2 s2 |, ?3 Z6 t/ E6 a. b( [, r- d: E$ m2 A
& \: R0 f- P: H
– 4 – CISPR 14-2 Amend. 2 © IEC:2008
5 `! T' q1 G* J6 A9 b" N: |Page 13& d0 m2 U. ~$ l2 {" E
4 Classification of apparatus; `+ h; q$ w/ |* F
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.
& K/ V: |& l0 nPage 15
9 E1 J# e2 C+ e, p% I5 Tests& Y7 L% w! _" U# P/ M
Throughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.) g+ o2 L* E4 N2 `
Page 21* E& L) m5 z( O$ d( t6 q$ e+ R
5.6 Surges
' B4 P7 E* W8 Z9 F+ qTable 12 – Input a.c. power ports
( f2 u4 k+ X# kIn the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
' e6 S' E% s( `$ t4 |"Line-to-Line with 2 Ω Impedance".
7 {( X8 @/ Z% z }# uAfter Table 12, add the following paragraph as a new second paragraph:
4 ~ Y' u' c0 N: W/ }The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
7 _( }0 B; o% ~# pequipment under test, and the negative pulses are applied 270° relative to the phase angle of: C) X I" P3 s: m2 u0 [
the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
% ]6 s K- c! ^/ g/ e7 Ugiven in Table 12 are not required.
2 d# e" ?5 i6 E! }" ^- T: L, A1 W5.7 Voltage dips and interruptions
3 ]( h5 p, K" v4 Q& T8 VTable 13 – Input a.c. power ports! V9 w0 S7 l% n6 w
Replace the existing Table 13 by the following new Table 13:
' p" z8 \& K8 M/ ~" n8 UTable 13 – Input a.c. power ports
5 g q! c9 ^" \0 I% pDurations for voltage dips
1 c i& _" I8 Z( L# n+ wEnvironmental Test set-up
2 f& \1 ~) b$ M Pphenomena
' A" w6 O; R# Z2 ^! hTest level
# C; y. x# v! u( ain % UT4 y. q. _ L! `: S# T* [; c1 ] J7 f
50 Hz 60 Hz' @+ C8 e2 ]; c) u# s3 L' ~
Voltage dips. j1 Q2 a) |) ?% B1 f
in % UT
?3 k* Y% q+ r4 Y# x2 X0 ?, y* w, J100
) j; b0 B1 e3 F& t6 k6 v. M4 s60/ h I; X& o9 s0 E, E
30
5 z3 _" C( q, l0
" z8 ]& U8 K( Y0 [" P' V. @40/ a, T% U+ p$ H
70
8 \0 k# v! s, v0,5 cycle# Q$ J( v* z6 j4 f
10 cycles1 S5 U/ d( l+ j' o( p8 ?# Z
25 cycles$ r- E5 q# b. P- T$ k/ v9 f
0,5 cycle
# ` [8 D8 v5 E4 r12 cycles
1 k# D% ~7 P, r( W30 cycles
5 t5 l0 W# w. L4 W0 @ cIEC 61000-4-11$ \1 t% E% Z& o5 C
Voltage change shall- w( p3 }0 K1 p7 o2 Z' W$ b
occur at zero crossing
, Y5 T9 _' K4 `7 O, {$ ?UT is the rated voltage of the equipment under test.) m+ r# c- W; T/ ?) A: H
3 S: j2 `) T7 O% t# p1 s* t1 P9 ?' }0 C$ ^6 C
CISPR 14-2 Amend. 2 © IEC:2008 – 5 –9 n5 z A4 U1 ~0 T/ n
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8 Conditions during testing$ J) |" @8 v# t& [ o
8.1 Replace the first paragraph by the following paragraph:/ i, O0 l, s1 v+ t2 N8 {- v
Unless otherwise specified, the tests shall be made while the apparatus is operated as
* J% V+ @- }. A7 Z3 \! y+ z& Gintended by the manufacturer, in the most susceptible operating mode consistent with normal6 E, u7 M9 k! l1 S) p1 Z6 {
use.! z; l& h5 n- s; o( [% i# U) u
8.4 Delete the second sentence.
# ]- h, n( ~, j% A1 a8.7 Delete this subclause.2 W3 m- J' j( H) L3 y5 ?! i% a
8.8 Renumber this subclause as 8.7
) i3 v9 S1 d( ?% @Page 29* @! Z) t% O/ A! u; v" q' q! h/ m
9 Assessment of conformity
* d2 [* B5 C1 p' A9.2 Statistical evaluation" x* H4 h7 U$ R
Replace the existing Note by the following:; l% ?2 q. l, I' t) C$ V
NOTE For general information on the statistical consideration in the determination EMC compliance, see
E* c. w R/ X- X M0 W2 q5 ^2 sCISPR/TR 16-4-3.
+ i4 E/ b8 N+ _* O2 x kPage 31
% K, [' q& j# `1 u# s10 Product documentation4 r* S+ [% Q: V1 [
Delete this clause.
( P8 y ?7 \' I/ dBibliography, J' U0 v7 y% o& a
Replace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:
" X6 v) \. S* g1 s: Z( vCISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
2 w- U# Z1 [4 A1 j h5 N8 V3 amethods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
( p# D( \: Y% _& Z1 t- R$ bthe determination of EMC compliance of mass-produced products (only available in English) |
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