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Standard(s):5 v- p, A4 i( p( O
IEC 61048/2006+ v; t9 H: E$ D* y- J" E
Subclause(s): 17
' a" i. p, L9 Y8 z( m6 \2 A' @No. Year PDSH 1004 20109 {8 w6 Z9 k7 U, X2 m
Category: LITE Developed by: ETF5 OSM/LUM$ A! }2 t0 l% I2 E' Z7 a
Subject:. X' z" j- z: }
Use of the previous tested sample9 v5 ]. t6 k# [
Key words:
$ t1 v6 t4 n7 @# [- Test time
/ E. F9 M" R; |- Destruction test
( }1 \( Q# C/ {+ Q, n3 p9 I( j- Proposal- M! [* a' ^: j1 j, V+ U% L( L1 y
To be approved at the 49th CTL Plenary Meeting, in 2012# P5 ^2 r1 T+ d! W
Question:+ G2 K* A0 @5 d2 n0 J
In order to reduce the test time and cost, would it be possible to perform the destruction test of § 17 on the
" O8 q' V7 S8 n2 `1 {) G2 r8 Dsamples used for the IEC 61049 (clause 8), compliance?
- i+ z+ `$ o' s5 UDecision:
7 t+ v" j/ L$ W x# O7 b" \Yes. L; j0 g8 e, i. ~0 k
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