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|  PDSH 1004; d* E3 Q \1 k2 l2 H9 M) x
1 [$ c1 n/ i' D7 K& l1 }. s | Use of the previous tested sample7 p) l7 I+ `( a: ?8 F# s
| 17
# F8 Y: j) f+ ~" Q | 61048(ed.2)
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+ T, ^, B6 y3 \Standard(s):
. {) t0 i$ v* FIEC 61048/2006
! V$ M, A+ B% x& gSubclause(s): 17
; W ]" l6 p# W) O% TNo. Year PDSH 1004 2010
4 L5 z: q% y |8 y" K" P! y. LCategory: LITE Developed by: ETF5 OSM/LUM
( r& `2 ~5 d; @+ O4 w0 a, mSubject:
7 W" G$ Y# U% eUse of the previous tested sample
, @ Y: X( w/ K& M; j1 q; XKey words:: W4 P5 A, |. Y4 ~$ w
- Test time% `# v: x2 D* O. B/ I) Z0 Q0 ?
- Destruction test& }. Q- G9 X( o$ Q4 _
- Proposal( ~5 I& R" Y+ W% X
To be approved at the 49th CTL Plenary Meeting, in 2012 a% E$ v' `# f+ j }( c: M3 g
Question:
9 k$ A8 m5 u' y' kIn order to reduce the test time and cost, would it be possible to perform the destruction test of § 17 on the W2 k" M5 \# o
samples used for the IEC 61049 (clause 8), compliance? g# L& d( ~ @! y
Decision:$ O1 M* E t2 W. I( c, m2 l5 J! N
Yes.% z- T/ b* w7 i8 r
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发表于 2012-9-17 16:06
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