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| DSH 457- D! H" K' @, ?( X5 B2 b/ ? r
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B9 h9 ] Z$ M( m7 ]5 W | Abnormal operation
4 D0 e1 h: l! c! p. t | 19
% z( \2 X, R0 S& V( {: k# A( A | 60335-1(ed.2)) G. x6 y4 c; I9 i) r& R/ ?
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Standard: IEC 60335-1:1976, 2nd Ed.! n& H: K+ ?0 F+ z( k+ g1 Y3 j' N
Sub clause: 19
; U4 k! f. E$ _5 p" N1 ZSheet No. DSH-457/ S I7 v; X9 F3 Z/ T
Subject: Abnormal operation
1 M+ O( [# R! c9 G$ qKey words: - thermostat an thermal cut out within the same component+ F* {+ _. _& m! W; F9 o* c" W
Decision taken at the 40th CTL meeting 2003
) ~1 Z8 X( f* q4 q/ W( I8 kQuestion:: I* O, V6 ]* ^- g; f3 E( Q) x1 T
How is a component with a thermostat or thermal cut-out or both within the same& L2 A' q, `) N- ?2 I- X# ^
component, having only one temperature sensing device, but operating two or more switch
$ B( s" R5 m4 V/ d2 i) b0 ], rparts in separate circuits tested?! x* Y2 `1 `3 t) Y/ S# h3 Q
Rationale:" V4 n, M( v4 C2 @. v- e5 S
See question.
3 W; ~4 x* w. }! c$ I* vDecision:/ J4 C/ W' u, u2 r% l
When a part of this component has to be short-circuited during the tests, all switch parts are
/ Z# ]- i! u9 q Fshort-circuited. C( \4 f! j7 n9 ~1 m+ A" x
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