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由于我的标准上有公司名字，就不直接贴上了，差异部分如下4 \2 A, v7 H' f# E2 N
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" ^: q+ ?# U) @+ z. a/ S1 Scope and object$ { G- K- r6 |9 f k* O6 a% [
Replace the title of this clause by “Scope”" x5 }4 b1 b% U$ J2 V
1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.9 [! B: T$ A/ B; a- W
Page 114 r( K+ W( b5 P3 R8 ?( J
2 Normative references: H3 w% c$ V, Z9 B1 Q7 E7 w3 o
Replace the text by the following:. `( R0 N7 `( {* t( Z( `8 x
The following referenced documents are indispensable for the application of this document.3 Y/ _5 _' o' t6 I
For dated references, only the edition cited applies. For undated references, the latest edition
- a+ G4 F: }0 `, K! _of the referenced document (including any amendments) applies.! Y) i4 @1 j* u# C4 @% m* h0 ?' r
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:
% t& H" }5 F8 sElectromagnetic compatibility9 O- ]3 I! b4 W1 @
W% L& S; }( v8 t
# B+ U3 Y# ]1 kCISPR 14-2 Amend. 2 © IEC:2008 – 3 –- G( {9 `0 H% f# u" d i' W
IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and: R; K1 V( ?7 m, D& [# I: g9 E: z
measurement techniques – Electrostatic discharge immunity test. ^1 `/ L9 H* P- k+ e0 ~
Amendment 1:1998( U% @( j, x- r
Amendment 2:200015 l. x# K. Y1 D
IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and8 D' N' q3 W6 A4 V1 V4 l
measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test* `$ I/ i" H0 j/ ]& \) O
Amendment 1:20072
+ ^0 s9 b7 b2 {' {IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and$ h' [( s$ w: U
measurement techniques – Electrical fast transient/burst immunity test, [: q; R4 N" K- I2 a; v
IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
) \! ~7 {( N5 B1 Tmeasurement techniques – Surge immunity test+ H( d, v- A0 \" r3 l
IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and9 J5 B0 P! {+ i u* F0 I
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency6 O8 Q- v% G9 G) M( |9 C
fields, r3 w3 z8 U/ Y+ v1 X: P
Amendment 1:20040 @$ ^& U5 g0 ?1 S, w/ }
Amendment 2:20063
1 k* P; O2 O0 {" n% W. I0 C+ k' x$ fIEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and
! e6 Q2 ^! Q I+ L- q$ T; o8 Nmeasurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
) h! Q% v: O# u2 v$ }CISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,5 j4 g: O2 m+ h$ m. j
electric tools and similar apparatus – Part 1: Emission7 |3 R! h& y: l. V- c
Page 13
: i8 H: ?4 `( o% A) U# F3 Definitions% G! z4 P# S5 F+ E7 t& Y
Replace the title of this clause by “Terms and definitions”.7 U% D! L; D P; o
Replace the first paragraph by the following:
+ E& g6 j" Z- u) n/ \For the purposes of this document, the terms and definitions related to EMC and related4 u2 [$ i! M" e7 \, s2 q/ ]" k+ N
phenomena found in IEC 60050-161, as well as the following terms and definitions apply.
; A/ }- [' ~7 b4 @( ~' xAdd the following new definition:+ ?& ]0 b. N c7 `3 }3 r
3.18
+ @ O; X5 G5 y5 R1 Tclock frequency2 Y) z, V, [7 x. E$ z
fundamental frequency of any signal used in the device, excluding those which are solely$ A4 a6 C0 O4 R. {9 p6 @
used inside integrated circuits (IC)6 W6 I4 m2 P: X/ i7 j$ f
NOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
[" o# C9 Q* R5 gfrom lower clock oscillator frequencies outside the IC.
5 e9 o: X$ v- ~6 s. T+ `___________ x# Y5 x: K" @
1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2." t) J. W/ c) `$ I* p
2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.- a t1 f' U$ Z% q
3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.
5 s7 m2 Z8 A( L X- g
9 P! E, E& X% `8 ^
& [0 N; I/ [& H' X, ?– 4 – CISPR 14-2 Amend. 2 © IEC:2008- k; ?5 y3 k5 i7 ^! Y6 J
Page 13
. t# b- o6 R- }/ I% l( S4 Classification of apparatus0 s4 [: X9 q% J* N
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.9 W- e0 |) I) S, ]$ q2 p* G" A
Page 153 B5 J; O8 i! H$ B4 S
5 Tests
+ H- E- h9 ^, ]Throughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.
8 D% t; ?' M6 j7 q3 j4 ?5 ? v. uPage 21! ~( P. R) x' K
5.6 Surges- e& c( s; z! x) z
Table 12 – Input a.c. power ports2 c% B9 ^8 ?! [6 c, f0 x; Y6 o
In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add( W1 W+ m+ \2 _
"Line-to-Line with 2 Ω Impedance"./ C8 ?4 o( X1 C2 ?9 b) P) y
After Table 12, add the following paragraph as a new second paragraph:
+ O/ r4 o, A7 ]* P% ?; {The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
* V8 o& Q( ]" l" \! ~equipment under test, and the negative pulses are applied 270° relative to the phase angle of w+ I3 P) R. p9 p6 u
the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those1 o6 l" r* L9 Y! z+ O- _
given in Table 12 are not required.
4 |$ P6 S/ U9 M/ y R$ q5.7 Voltage dips and interruptions
2 P( ?* d2 M; G4 R8 K# lTable 13 – Input a.c. power ports
+ y$ a8 o6 U$ |: ?Replace the existing Table 13 by the following new Table 13:
8 t+ c! F; J0 x( y8 y+ t- mTable 13 – Input a.c. power ports3 w, l' [1 i5 ^: s& s) c
Durations for voltage dips
6 ]$ [) r4 R( W" ~! W, M9 R+ ^Environmental Test set-up8 E: o' Q+ G: C- W- r" t! l. u
phenomena2 e1 S S5 \9 p' n0 {4 U, D
Test level
1 _1 S6 J! e7 C4 Q! uin % UT
' b8 A% e" Z7 b) b9 E5 U50 Hz 60 Hz
4 E2 L/ U6 c) j6 T+ d n! rVoltage dips5 F8 ^; }9 z. \3 Q8 Y K
in % UT
; l) Y* \4 j1 o# {8 A; B1 C* V/ a100; {* I0 g% P* E$ E% b7 ~$ X9 W
60: B) M) e- e4 {
30
G: O# q) e* W0 i# }/ t00 Q% t% O( u, K
404 m3 x' T' c% [) @
70" Q9 I1 f& [' y, C6 v& J% T, }
0,5 cycle5 V/ ]4 F1 N' R* ]0 L
10 cycles
8 F. p9 I* y5 {% }: s5 o. x25 cycles
: O3 s8 \; L5 G' {1 M {6 f0,5 cycle
. e! b+ S! f) l7 @5 R2 s12 cycles
* a+ a/ ?3 J: C7 `- I30 cycles. i& e1 j( T" e2 Q ]; S
IEC 61000-4-113 j6 E4 s5 D# M: v3 J7 o; Q
Voltage change shall
# _! b8 f! e/ j+ F5 T: Ooccur at zero crossing8 c, k# ^$ |! E; t
UT is the rated voltage of the equipment under test.
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/ p- d5 v! h$ b" }7 m q/ a1 l( l* }, O! J5 f+ Q4 p) L4 R1 C
CISPR 14-2 Amend. 2 © IEC:2008 – 5 –
* R9 W! ~+ z8 Z$ C( m1 V$ c0 G6 A8 ZPage 27 J! R) c* ~% w& G% ^! y& b0 K
8 Conditions during testing2 H8 B1 B1 F* M6 s8 d. E. S
8.1 Replace the first paragraph by the following paragraph:1 W- R3 _5 n2 l0 x
Unless otherwise specified, the tests shall be made while the apparatus is operated as4 N- Y$ s6 _/ n$ F2 y
intended by the manufacturer, in the most susceptible operating mode consistent with normal! D9 z8 o: x- n$ I. T
use.: j/ {2 L& `% E/ |( e
8.4 Delete the second sentence.! S+ [4 }. V; x$ H, H2 b* k8 p/ `
8.7 Delete this subclause.
z; H/ e# S4 W) F" ]: z5 c8.8 Renumber this subclause as 8.7* r7 I8 j; c7 F2 g
Page 29
. F: ]( C# s+ m' ]) b9 Assessment of conformity( O$ r0 g8 R, O# q+ K. v
9.2 Statistical evaluation% Y( |# G4 c+ ]/ w! M6 @3 B
Replace the existing Note by the following:! N/ M% {* P. n1 t# m
NOTE For general information on the statistical consideration in the determination EMC compliance, see7 }: K/ L3 W! }( J
CISPR/TR 16-4-3.
; N, W0 Z# O3 Z, NPage 31/ C3 w8 M3 g! {$ _' V
10 Product documentation$ E* o3 _1 Z7 v" _% V' O
Delete this clause. _1 v% S# c$ y" o0 D: e
Bibliography* L: b. w" ^" |
Replace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:8 M6 g: I; |! G! d& x) D% I2 I
CISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and- U, ?1 H- t8 N+ H% k
methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in; o& R2 T% L$ _* a
the determination of EMC compliance of mass-produced products (only available in English) |
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