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| DSH 405 x3 q8 y( T' _. B! J l9 t) [
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| Leakage current in secondary circuits
7 h2 a; B& a6 G& J1 }& X2 _ | 17g)2 X3 e; t9 q/ @8 ^
| 60601-1(ed.2);am1;am2% B7 D( @: l& E
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# j/ Z$ g. [7 {Standard(s)- (year and edition):
2 |7 O5 F% e9 L" T% x( `IEC 60601-1:1988 Ed.2 Am1+Am2
: Z) ]/ Y( ]- K' z2 m6 V0 kSub clause(s): 17 g)
; q! R p2 F- k" tSheet n°: DSH-4057 N" c5 p2 Z; o% [5 t/ R3 N
Subject: Leakage current in secondary circuits
5 c# b" J: }" K- tKey words: Leakage current, secondary circuit
( p! ?+ s' X+ @4 m- P0 O8 l( aConfirmed by CTL at its 39th meeting, in Cologne
+ C% f( F1 u: h8 P( i% m9 l8 DQuestion:, Z# H( Z* N6 ] b$ V# G9 C& _
If secondary circuit impedances limit the leakage current, is further investigation of secondary
, L1 M, v5 j2 l. w. u3 Lcircuits required? (refer to sub-clause 52.5).
# g; [. s9 z1 K& S g; rDecision:
+ K( v P8 v) k* _% G: DSecondary circuits providing protective means after short-circuiting of inadequate AIR u( ]1 `, X7 e# i1 w: n
CLEARANCE and CREEPAGE DISTANCE must be investigated. Failure of components in7 o6 i3 ~. L0 p& U
these circuits shall be investigated as a SINGLE FAULT CONDITION. Failure of such1 N3 c# w) ], j% o3 ]1 |
components shall be investigated as a SINGLE FAULT CONDITION.& {- C' L$ E& E3 G, h, P
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