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|  PDSH 1004
( _ [/ S) Q p' D9 t% \) f2 p- z2 c- A! ^% e, v; P
| Use of the previous tested sample) x6 b/ C. O) C4 m& v8 S& z
| 17
8 q4 w5 v% o$ L+ N4 c2 S | 61048(ed.2)4 Z+ @. U% C2 L
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: I, s0 Q2 V$ r( e$ QStandard(s):
8 x7 l. V8 Z* kIEC 61048/2006
+ S" Z$ w8 D2 n$ Y' [Subclause(s): 17
8 @" M) X4 [7 k; U% p2 ENo. Year PDSH 1004 2010
4 x" @, S$ b: e9 y/ _Category: LITE Developed by: ETF5 OSM/LUM
; T1 g, j- U$ V0 K7 cSubject:
8 s0 W7 @( C1 B0 D3 x" [Use of the previous tested sample! N; u. J( N7 @
Key words:, q/ T8 d! ^0 v7 y
- Test time6 r' [. f( O, P4 ~4 F
- Destruction test
2 r* ~1 I+ b m5 v# o" i3 }. S- Proposal
6 | E' B7 G6 G* M) iTo be approved at the 49th CTL Plenary Meeting, in 2012
# M' _' g+ J) o5 AQuestion:6 C3 l4 r- T, `# q8 A. {
In order to reduce the test time and cost, would it be possible to perform the destruction test of § 17 on the6 n Z! ]+ G+ l* N& H, w8 m
samples used for the IEC 61049 (clause 8), compliance?- [8 P7 Q. R. x; o! \
Decision:+ b% d; p6 ?" B! b) M2 ]* c2 M
Yes.
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发表于 2012-9-17 16:06
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