4 [* L5 F2 i6 p) t3 K- t% h17 Behaviour of the ballast at end of lamp life& m+ y1 v$ v( g. h C- g! Z
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17.1 End of lamp life effects & @; h! b6 V/ Z {6 l 7 l9 m3 K. M- Z3 YAt the end of lamp life the ballast shall behave in such a way that no overheating of lamp cap(s occurs at any voltage between 90% and 110% of the rated supply voltage.* L/ N6 ^$ F: [2 s0 h
2 X, v! r9 o$ d% R/ w) a' R4 F For the test simulating end of lamp life effects, three tests are described: X8 V6 z6 @1 P z& P6 f
a) asymmetric pulse test (described in 17.2);9 @9 |6 `1 H1 |& M3 G$ D7 s
b) asymmetric power dissipation test (described in 17.3); ! [; H5 C. {* }9 Ac) open filament test (described in 17.4). 1 w+ N) C% r: e 9 O) {6 l- M- n7 ?) O" |8 s, [7 T% gAny of the three tests may be used to qualify electronic ballasts. The ballast manufacturer shall determine which of the three tests will be used to test a given ballast based on the design of that particular ballast circuit. The chosen test method shall be indicated in the ballast manufacturer’s literature. / M" s5 x. S9 Q0 u* `" [8 D1 b1 A0 k" i5 G6 O1 t- }0 |5 u* [
NOTE Checking ballasts against their capability to cope with the partial rectifying effect is recommended by IEC 61195, Annex E, and IEC 61199, Annex H. / f% I7 R" O$ ?; N6 v Lamps used in the ballast test circuits shall be new lamps seasoned for 100 h.