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标题: CE标准/EN 55014升级了吗？ [打印本页]
作者: ALICE    时间: 2008-11-25 19:34
标题: CE标准/EN 55014升级了吗？
各位8 T% l" V$ y, K6 f. C) ?4 `( g! u; `
上周拿一个样机给认证机构做EMC测试，出草稿报告,审核时发现标准中的一条写：EN55014-2：1997+A1：2001+A2：2008.
) Q( N; o9 X& ~1 {0 T" C请问，CE的EN55014版本升级了吗？什么时候开始实施？增加的A2主要测试那方面的，是否所有EMC测试都有这要求？请大家告知。谢谢！
作者: Naomi    时间: 2008-11-26 10:46
A2:2008 of EN 55014-2:1997 已經 於 10 月投票通過: V" o# O& w. Y4 d) N* q) ?
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預計於 2011年9月1日起實施& m- z! `2 J3 b  l! M0 m

2 \% u$ q4 g8 j5 Q5 c7 I4 C  J所以 2008年11月4日公告的 harmonized standards 中並未有此一amemdent !
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% j6 i% t" t! {( L& n$ J$ |/ a( W至於內容,..... 目前還買不到 法規 ........
作者: andyjiang    时间: 2008-11-26 17:32
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作者: leontong1    时间: 2008-11-27 13:06
如果是报告EN55014-2：1997+A1：2001+A2：2008. 没有问题，) {  p$ W# t% Q4 g! Z0 ^- ~% C" C
但是如果是证书，由于EN55014-2：1997+A1：2001+A2：2008不在oj的harmonized standards 上，所以不能列
作者: ALICE    时间: 2008-11-28 14:17
{預計於 2011年9月1日起实施}??
, L2 g  P. ?6 X4 x  h2 S认证机构再次发报告给我审核把A2:2008删掉了,说现在还没有实施,不可以写,等2009年6月1号实施再加几百元报告费,请问预计实施的真正时间?认证机构的做法合理吗
作者: leontong1    时间: 2008-12-1 11:27
引用第4楼ALICE于2008-11-28 14:17发表的  :
5 A- `  W2 z, L9 f- v" S$ t{預計於 2011年9月1日起实施}??- _" l' z% G1 a! g7 T4 A- {
认证机构再次发报告给我审核把A2:2008删掉了,说现在还没有实施,不可以写,等2009年6月1号实施再加几百元报告费,请问预计实施的真正时间?认证机构的做法合理吗
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预计实施的真正时间要等明年的OJ公布，7 T2 L& l& R1 D
认证机构的做法是合理的但是没有必要去做，新旧标准有一定时间的过渡期的，过渡期内新旧标准同时合法
作者: Naomi    时间: 2008-12-3 09:20
如果 測試有依據 A2：2008 的話, 報告中肯定可以加上A2：2008
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* p& }' c7 ?) C) A* V: J問題是 除了EU會員國外, 有人有 A2:2008 法規嗎?
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2011年9月1日 還有2年多, 誰知道那時會不會有新標準!
作者: ALICE    时间: 2008-12-15 09:18
测试机构通知A2：2008是2009.6.1开始实施，希望楼主有相关标准资料，发出参考。EMC经常要用到
作者: kxlaser    时间: 2008-12-17 11:36
预计实施的真正时间要等明年的OJ公布，! t$ |& w4 p' ]
认证机构的做法是合理的但是没有必要去做，新旧标准有一定时间的过渡期的，过渡期内新旧标准同时合法
作者: Naomi    时间: 2008-12-21 15:56
請參考附件
6 f; `+ h8 K. x# a7 i' P+ q% L7 ~. K* j0 E: N9 J
其中,
& V0 \* @! J# F4 ?" ^8 nDOP : 表示發行日期
) A+ x+ s' |7 L通常DoP 之後就可以開始使用  [7 L' F  z+ R. g! l; A& v- Z9 R
* i; Y) }$ _; n" |+ v/ Z
DOW :  表示強制日期
1 R1 i1 O/ i& G( Y( V在此日期後, 必須使用此版本法規
3 z) w; P6 @; j5 c! }6 J. Y8 w; p/ d9 W1 S6 q  t0 H# Q3 u" `

5 L, w; G% ?8 ^/ d$ f; Y2008/12/1 雖然已經確定此版本了
0 w" i8 p/ r& q' |0 S1 K但是尚未發行,  一般也不能使用該版本法規
作者: 2iso    时间: 2009-3-11 08:21
引用第9楼Naomi于2008-12-21 15:56发表的  :7 _0 ^0 L" G0 W# d& `" Y0 n" _2 V% E
請參考附件$ p# A: n3 ~7 |) `

( i. C5 L. y( Q4 @3 ^$ S其中,
% [+ ?! y6 p* m) M) H, W5 cDOP : 表示發行日期
6 J# w/ m" y( y2 G通常DoP 之後就可以開始使用4 _& U$ ~% Y: N$ ~$ {0 r
.......
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& h7 `. r  P8 F: X" ~, @% [可以贴上链结网址吗? 谢谢.
作者: william_hp    时间: 2009-3-13 10:04
有没有附件传上来
作者: daisy_1208    时间: 2009-3-24 20:52
引用第10楼2iso于2009-03-11 08:21发表的  :
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1 G$ H; j9 D& v/ S2 K7 |( }可以贴上链结网址吗? 谢谢.
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http://tcelis.cenelec.be/pls/por ... ;p_arg_values=21247
作者: longclever    时间: 2009-6-3 09:46
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作者: louislin    时间: 2009-6-3 10:06
由于我的标准上有公司名字，就不直接贴上了，差异部分如下
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Page 9
, w* w. D" r' Z- q  \9 c. t* K1 Scope and object2 n9 S: ]+ s' X* }: y4 n
Replace the title of this clause by “Scope”
7 V. V' q: \+ @1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.3 V- L4 E" A7 @3 z, ?
Page 11
2 }6 A% B3 ^9 ~4 G2 Normative references
- v7 \* ^( l' Y, B% s& M; n6 ?Replace the text by the following:. j4 l; v8 n  d/ {* i0 L
The following referenced documents are indispensable for the application of this document.
$ D- i2 m3 }( w* bFor dated references, only the edition cited applies. For undated references, the latest edition& R# x/ X4 m# m2 A( h5 }
of the referenced document (including any amendments) applies." A/ B+ V5 P3 m- H: U
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:
" h1 _7 U3 E1 y/ [- h  e3 yElectromagnetic compatibility. A9 o: K% I  ~( {2 V6 q) f
( H+ U6 B: n8 H& k
) a" R. H& ]( {/ k0 Y: ?1 j" X$ n
CISPR 14-2 Amend. 2 © IEC:2008 – 3 –, U' \' v) I7 O- h+ k& ?
IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
4 Q, y7 r( a1 Lmeasurement techniques – Electrostatic discharge immunity test: I  s0 R$ G# G# R
Amendment 1:19987 x1 h0 b' G3 r4 r
Amendment 2:20001
  o, i6 H" S: \0 n- C3 xIEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and5 V: w3 z9 _1 G5 j
measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test" K- P/ ?! M/ |: K/ }& C
Amendment 1:20072
8 }, l& U/ t3 d8 F: YIEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and5 E9 n. Q' c7 ^: B' H4 W$ C
measurement techniques – Electrical fast transient/burst immunity test. o& s% Z2 @# d7 U
IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and+ {7 d6 r! E, {% t# ^/ I# h+ U5 B
measurement techniques – Surge immunity test  e4 _2 ]! x1 K+ m" t
IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and
# r* |& ?2 {2 C+ R% k! A. U& Emeasurement techniques – Immunity to conducted disturbances, induced by radio-frequency
, B; S' l, l/ I3 |6 z, U; G, Bfields
( r- r3 N0 @: t9 k2 yAmendment 1:2004. f) G2 V: ]3 H
Amendment 2:20063
% O: z5 Z- f: HIEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and# [* }: e% ^- y/ w: @
measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
# w* I7 C% i9 vCISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances," W0 ~! j' A0 K7 ]. U8 d
electric tools and similar apparatus – Part 1: Emission
& V7 H8 t% q' T) ZPage 13+ k* Q. x3 S9 ]9 {- f8 J
3 Definitions
# S5 Z& Y. P0 A9 z( Z( jReplace the title of this clause by “Terms and definitions”.- I* N! C2 e. d+ {4 k/ z
Replace the first paragraph by the following:! r  ]( M+ }5 ]+ [! X
For the purposes of this document, the terms and definitions related to EMC and related
( e6 y, W1 z3 Lphenomena found in IEC 60050-161, as well as the following terms and definitions apply.
. X8 s) H# t0 a) VAdd the following new definition:' I1 @) d. z# q- q- i) d
3.189 s+ i+ j4 Z& x& E: J3 G  g
clock frequency
( n. P. ~5 X- I( ]9 U( d* cfundamental frequency of any signal used in the device, excluding those which are solely; s( t& ~* W, N
used inside integrated circuits (IC)4 o$ S& @1 i6 P: C
NOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
% Q) l: o3 I, l# Ifrom lower clock oscillator frequencies outside the IC.
+ W6 v, a8 N% E/ l* n___________( w  x6 e" F3 |. E, z6 P3 q7 M2 }
1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
+ J" u0 z" R; G+ n+ z* L8 s2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.: F7 I5 ?1 _! p7 p# g
3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.
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; n, S& F) L& m3 k3 t– 4 – CISPR 14-2 Amend. 2 © IEC:2008
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4 Classification of apparatus
5 @4 n5 D/ b! R+ s1 ?  G9 H0 Z% @4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.
# ?& p7 g# w7 f; f8 j4 s- dPage 15
9 X" a0 Z$ ^* F0 i" N5 Tests) T; Z2 s, l' F& O5 [( p: H( J2 ^* ~3 Y
Throughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.3 }% u8 |1 w. p. X! U; b4 o6 h- h
Page 21
$ {6 g/ u( ^& v4 m- m% H5.6 Surges* V/ w& E! F8 W& Y7 \: O
Table 12 – Input a.c. power ports$ j% S+ a4 S3 V# ]+ k3 f" e, m
In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add1 v5 R: m# X8 q6 P
"Line-to-Line with 2 Ω Impedance".
8 u7 S5 L8 M/ O( S' [After Table 12, add the following paragraph as a new second paragraph:" c6 i9 a' j- u) Z7 {! l
The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
$ s1 T! l1 K( V7 Z; requipment under test, and the negative pulses are applied 270° relative to the phase angle of
$ s+ p. f1 R+ K, [  J: Z  Qthe a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those" A1 K, d- F- L8 x7 M2 [( z
given in Table 12 are not required.. y/ I) C' I/ }$ I
5.7 Voltage dips and interruptions
4 o* L  A! S0 R" q, `Table 13 – Input a.c. power ports
. b, e4 E5 D5 X6 j0 D0 MReplace the existing Table 13 by the following new Table 13:4 O, j/ `, w# @5 g  U8 D7 u& n
Table 13 – Input a.c. power ports
9 @% _: N2 ^0 E4 ^+ {* r3 f4 FDurations for voltage dips
/ |5 e, ?, s1 }9 }) y. {# S+ REnvironmental Test set-up
# \, Y2 h1 {' [9 G# v: Wphenomena
* x: C1 R  P$ G* P3 Q! _" ZTest level4 ~5 D: V: N" @' n" C/ G
in % UT
  ~! }* [. O) i! @1 Z50 Hz 60 Hz
+ p0 q7 D6 ]1 m) u( g/ {, Z3 n5 KVoltage dips
8 f% Y( \+ |; {! l3 X9 d5 win % UT' e0 y0 R6 [# t9 d7 O
100" v9 l8 ~& A) `" x
60+ D, t% \, z% p/ I) A
30+ u$ P" `' |* ~" O% b
0
. ~3 V) r: m! }7 d1 {: _; _0 s% H40
! c# I+ ]: F# Z* [. o: h! Z70  }2 e$ j- S. b" x  o
0,5 cycle
5 u( o; K8 Y! J10 cycles
3 G- ?' K* o& J' t25 cycles- I8 S* X% v- ~, J* i
0,5 cycle' C# k& n8 t' B" x9 G' [; D1 n1 n+ K
12 cycles: }" E% \0 U7 W/ `$ k
30 cycles0 B' W# S8 j$ _3 J2 F: f( c9 u
IEC 61000-4-11% u0 a; `( l- u. F9 J+ |
Voltage change shall# u0 E7 B$ o/ m  U5 C2 C
occur at zero crossing
$ F* {% ]9 X3 C( rUT is the rated voltage of the equipment under test.. ~9 M  t% _$ Y5 c; V" Z

4 |  X9 Z5 u* H1 _
( A- R( ^$ |+ g* K4 Z2 X" a9 `CISPR 14-2 Amend. 2 © IEC:2008 – 5 –; X1 X* ~- c" W5 k& Y( U1 ]& m
Page 27
9 S# ?/ m- [' }( ?6 C9 x! r! z8 Conditions during testing5 [) S, b4 O  [
8.1 Replace the first paragraph by the following paragraph:  Z% J! [$ W  b: b. z2 p8 o
Unless otherwise specified, the tests shall be made while the apparatus is operated as
# t- x; A. ~/ a  M8 I8 Gintended by the manufacturer, in the most susceptible operating mode consistent with normal
3 h5 ~! `( H. m5 I) t- a9 Ouse.
4 `- s0 U, ~. U& K8.4 Delete the second sentence., S7 S! P1 {! M4 _5 B
8.7 Delete this subclause.
' _. ?: O3 ]6 R: L6 A& w8.8 Renumber this subclause as 8.7
6 Y8 {  g' y# F( b4 W0 EPage 29
( c9 A! R! K' H- p/ M( F9 Assessment of conformity
. ?8 N5 \) j7 W' y0 T: l( h9.2 Statistical evaluation! d7 u9 J2 Q9 ~  g# ?
Replace the existing Note by the following:* J' L2 s) m: K; G# X% [# n# T2 D
NOTE For general information on the statistical consideration in the determination EMC compliance, see( K. ^6 q0 j# b: ]1 r
CISPR/TR 16-4-3.0 q% e0 p0 [+ I( A
Page 31
- g9 R0 H4 x% n/ R10 Product documentation# }; f( x+ F0 g1 B& S4 T2 x
Delete this clause.
. P5 D9 v+ U0 L, [: YBibliography
5 C$ ?) X% Q) e  N  R  lReplace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:
1 x" b' q  L& P6 A( wCISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
# Z2 X; ?; Y  O- y' Z+ Wmethods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
) Z( C6 D# X/ K: ~8 Vthe determination of EMC compliance of mass-produced products (only available in English)
作者: honglipardon    时间: 2013-6-24 15:18
学习到了~



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